Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy

• Zahra Abooalizadeh,
• Leszek Josef Sudak and
• Philip Egberts

Beilstein J. Nanotechnol. 2019, 10, 1332–1347, doi:10.3762/bjnano.10.132

• modulus of highly oriented pyrolytic graphite (HOPG), specifically by using force modulation microscopy (FMM) and contact resonance (CR) AFM. In both of these techniques, a variation in the amplitude signal was observed when scanning over an uncovered step edge of HOPG. In comparison, no variation in the

• (FMM) and contact resonance (CR) AFM, will allow for the overarching goal of nanoscale mechanical property measurements to be realized. In FMM, the tip is pressed into contact with the surface and oscillated at a frequency off resonance. The obtained variations in the measured amplitude of the

• lateral forces over the step edges. Results of contact resonance (CR) AFM experiments Figure 4a shows a topographic image of another region on the HOPG surface containing both uncovered and covered steps acquired with tip B. Figure 4b shows the lateral force map acquired in the reverse scan direction. The

Scanning speed phenomenon in contact-resonance atomic force microscopy

• Christopher C. Glover,
• Jason P. Killgore and
• Ryan C. Tung

Beilstein J. Nanotechnol. 2018, 9, 945–952, doi:10.3762/bjnano.9.87

• can affect the accuracy of the output data of AFM experiments. We focus exclusively on contact-mode AFM techniques. In particular, we study these phenomena using contact-resonance (CR) AFM techniques [1]. CR has been chosen in this study because it operates in the linear repulsive region of the tip